A Theoretical Reexamination of the π‐Bond Strengths within the SiH2═XHn System

Publisher: John Wiley & Sons Inc

E-ISSN: 1229-5949|36|1|123-129

ISSN: 1229-5949

Source: BULLETIN OF THE KOREAN CHEMICAL SOCIETY (ELECTRONIC), Vol.36, Iss.1, 2015-01, pp. : 123-129

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Abstract