Comparative study of source–drain contact metals for amorphous InGaZnO thin‐film transistors

Publisher: John Wiley & Sons Inc

E-ISSN: 1938-3657|22|6|310-315

ISSN: 1071-0922

Source: JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY, Vol.22, Iss.6, 2014-06, pp. : 310-315

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Abstract