Application of Novel Thermal AFM Scanning Probe Techniques in the Adhesion Studies of E. coli Cells

Publisher: Bentham Science Publishers

E-ISSN: 1876-4037|4|2|86-91

ISSN: 1876-4029

Source: Micro and Nanosystems, Vol.4, Iss.2, 2012-06, pp. : 86-91

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract