Characterizing silicon intercalated graphene grown epitaxially on Ir films by atomic force microscopy

Author: Yong Zhang   Ye-Liang Wang   Yan-De Que   Hong-Jun Gao  

Publisher: IOP Publishing

E-ISSN: 1741-4199|24|7|78104-78107

ISSN: 1674-1056

Source: Chinese Physics B, Vol.24, Iss.7, 2015-07, pp. : 78104-78107

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Abstract