An application of impediography to the high sensitivity and high resolution identification of structural damage

Author: Zhao L   Yang J   Wang K W   Semperlotti F  

Publisher: IOP Publishing

E-ISSN: 1361-665X|24|6|65044-65055

ISSN: 0964-1726

Source: Smart Materials and Structures, Vol.24, Iss.6, 2015-06, pp. : 65044-65055

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Abstract