Study of impurity distribution in mechanically polished, chemically treated and high vacuum degassed pure niobium samples using the TOFSIMS technique

Author: Joshi S C   Bose A  

Publisher: IOP Publishing

E-ISSN: 1361-6668|28|7|75007-75026

ISSN: 0953-2048

Source: Superconductor Science and Technology, Vol.28, Iss.7, 2015-07, pp. : 75007-75026

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