Optical signatures of intrinsic electron localization in amorphous SiO2

Author: El-Sayed A-M   Tanimura K   Shluger A L  

Publisher: IOP Publishing

E-ISSN: 1361-648X|27|26|265501-265506

ISSN: 0953-8984

Source: Journal of Physics: Condensed Matter, Vol.27, Iss.26, 2015-07, pp. : 265501-265506

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Abstract