Initial defect configuration in NiO film for reliable unipolar resistance switching of Pt/NiO/Pt structure

Author: Phark S-H   Chae S C  

Publisher: IOP Publishing

E-ISSN: 1361-6463|48|15|155102-155105

ISSN: 0022-3727

Source: Journal of Physics D: Applied Physics, Vol.48, Iss.15, 2015-04, pp. : 155102-155105

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Abstract