Author: Hanachi Houman Liu Jie Banerjee Avisekh Chen Ying
Publisher: IOP Publishing
E-ISSN: 1361-6501|26|6|65604-65615
ISSN: 0957-0233
Source: Measurement Science and Technology, Vol.26, Iss.6, 2015-06, pp. : 65604-65615
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Abstract
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