The effect of patch potentials in Casimir force measurements determined by heterodyne Kelvin probe force microscopy

Author： Garrett Joseph L Somers David Munday Jeremy N

E-ISSN： 1361-648X|27|21|214012-214019

ISSN： 0953-8984

Source： Journal of Physics: Condensed Matter, Vol.27, Iss.21, 2015-06, pp. : 214012-214019

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

AFM tip characterization by Kelvin probe force microscopy

New Journal of Physics, Vol. 12, Iss. 9, 2010-09 ,pp. : 334-347

IOP Publishing

Access to resources Recommend Favorite

Electrical characterisitics of ferritin cores investegated by Kelvin Probe force microscopy

Journal of Physics: Conference Series , Vol. 100, Iss. 5, 2008-03 ,pp. : 16-19

IOP Publishing

Access to resources Recommend Favorite

Studying electric field profiles in GaAs-based detector structures by Kelvin probe force microscopy

By Vilisova M. Germogenov V. Kaztaev O. Novikov V. Ponomarev I. Titkov A.

Technical Physics Letters, Vol. 36, Iss. 5, 2010-05 ,pp. : 436-438

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

Study of electric field distribution in AlGalnP light-emitting diode by Kelvin probe force microscopy

Journal of Physics: Conference Series , Vol. 541, Iss. 1, 2014-10 ,pp. : 296-299

IOP Publishing

Access to resources Recommend Favorite

Quantitative non-contact dynamic Casimir force measurements

EPL (EUROPHYSICS LETTERS), Vol. 85, Iss. 3, 2009-02 ,pp. : 31001-31001

Edp Sciences

Access to resources Recommend Favorite