Determination of the London penetration depth of FeSe0.3Te0.7 thin films by scanning SQUID microscope

Author: Lin H T   Wu S L   Wang J W   Chen T J   Wang M J   Chen J C   Wu M K   Chi C C  

Publisher: IOP Publishing

E-ISSN: 1361-6668|28|8|85006-85012

ISSN: 0953-2048

Source: Superconductor Science and Technology, Vol.28, Iss.8, 2015-08, pp. : 85006-85012

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