Author: Lange Jane M. Hubbard Rebecca A. Inoue Lurdes Y. T. Minin Vladimir N.
Publisher: Wiley-Blackwell
E-ISSN: 1541-0420|71|1|90-101
ISSN: 0006-341X
Source: Biometrics, Vol.71, Iss.1, 2015-03, pp. : 90-101
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Abstract
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