Goodness-of-fit tests for binomial AR(1) processes

Author: Kim Hee-Young   Weiß Christian H.  

Publisher: Taylor & Francis Ltd

E-ISSN: 1029-4910|49|2|291-315

ISSN: 0233-1888

Source: Statistics, Vol.49, Iss.2, 2015-03, pp. : 291-315

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Abstract