Carpenter, J. R., and Kenward, M. G. Multiple Imputation and its Application. Wiley, Hoboken, New Jersey.

Author: Park Sohee  

Publisher: Wiley-Blackwell

E-ISSN: 1541-0420|71|2|559-560

ISSN: 0006-341X

Source: Biometrics, Vol.71, Iss.2, 2015-06, pp. : 559-560

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