Measurement of Refractive Index Ranging from 1.42847 to 2.48272 at 1064 nm Using a Quasi-Common-Path Laser Feedback System

Author： LingXu Yi-DongTan Shu-LianZhang Li-QunSun

Publisher： IOP Publishing

E-ISSN： 1741-3540|32|9|90701-90704

ISSN： 0256-307X

Source： Chinese Physics Letters, Vol.32, Iss.9, 2015-09, pp. : 90701-90704

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