A Model to Improve Analysis of CNTFET Logic Gates in Verilog-A - Part II: Dynamic Analysis

Publisher: Bentham Science Publishers

E-ISSN: 1875-6786|11|6|770-783

ISSN: 1573-4137

Source: Current Nanoscience, Vol.11, Iss.6, 2015-01, pp. : 770-783

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Abstract