Employing second‐order mutation for isolating first‐order equivalent mutants

Publisher： John Wiley & Sons Inc

E-ISSN： 1099-1689|25|5-7|508-535

ISSN： 0960-0833

Source： SOFTWARE TESTING, VERIFICATION & RELIABILITY (ELECTRONIC), Vol.25, Iss.5-7, 2015-08, pp. : 508-535

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