Out‐of‐focus background subtraction for fast structured illumination super‐resolution microscopy of optically thick samples

Publisher： John Wiley & Sons Inc

E-ISSN： 1365-2818|259|3|257-268

ISSN： 0022-2720

Source： JOURNAL OF MICROSCOPY, Vol.259, Iss.3, 2015-09, pp. : 257-268

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