Origin of Leakage Paths Driven by Electric Fields in Al‐Doped TiO2 Films

Publisher: John Wiley & Sons Inc

E-ISSN: 1521-4095|26|48|8225-8230

ISSN: 0935-9648

Source: ADVANCED MATERIALS, Vol.26, Iss.48, 2014-12, pp. : 8225-8230

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Abstract