Doubly‐Charged Xe Ions Evidenced by Time Resolved RPA Measurement in the Far Field Plume of a Low‐Power HET

Publisher： John Wiley & Sons Inc

E-ISSN： 1521-3986|55|7|529-537

ISSN： 0863-1042

Source： CONTRIBUTIONS TO PLASMA PHYSICS (ELECTRONIC), Vol.55, Iss.7, 2015-08, pp. : 529-537

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