A regional ionospheric TEC mapping technique over China and adjacent areas on the basis of data assimilation

Publisher: John Wiley & Sons Inc

E-ISSN: 2169-9402|120|6|5049-5061

ISSN: 2169-9380

Source: JOURNAL OF GEOPHYSICAL RESEARCH: SPACE PHYSICS, Vol.120, Iss.6, 2015-06, pp. : 5049-5061

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Abstract