Effects of temperature and humidity on atomic force microscopy dimensional measurement

Publisher: John Wiley & Sons Inc

E-ISSN: 1097-0029|78|7|562-568

ISSN: 1059-910x

Source: MICROSCOPY RESEARCH AND TECHNIQUE, Vol.78, Iss.7, 2015-07, pp. : 562-568

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract