Mechanisms of matter‐wave diffraction and their application to interferometers

Publisher: John Wiley & Sons Inc

E-ISSN: 1521-3978|63|6|337-410

ISSN: 0015-8208

Source: FORTSCHRITTE DER PHYSIK/PROGRESS OF PHYSICS (ELECTRONIC), Vol.63, Iss.6, 2015-06, pp. : 337-410

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Abstract