A model‐driven approach to detect faults in FOSS systems

Publisher: John Wiley & Sons Inc

E-ISSN: 2047-7481|27|4|294-318

ISSN: 2047-7473

Source: JOURNAL OF SOFTWARE: EVOLUTION AND PROCESS (ELECTRONIC), Vol.27, Iss.4, 2015-04, pp. : 294-318

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Abstract