Damage‐resistance matrix embedding framework: the contradiction between robustness and embedding efficiency

Publisher: John Wiley & Sons Inc

E-ISSN: 1939-0122|8|9|1636-1647

ISSN: 1939-0114

Source: SECURITY AND COMMUNICATION NETWORKS (ELECTRONIC), Vol.8, Iss.9, 2015-06, pp. : 1636-1647

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Abstract