Optoelectronic performance of poly(p‐phenylenevinylene)‐based heterostructures evaluated by scanning probe techniques

Publisher： John Wiley & Sons Inc

E-ISSN： 1521-3951|246|11‐12|2828-2831

ISSN： 0370-1972

Source： PHYSICA STATUS SOLIDI (B) BASIC SOLID STATE PHYSICS, Vol.246, Iss.11‐12, 2009-12, pp. : 2828-2831

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Abstract

AbstractThin polymer blend films made of donor and acceptor poly(p‐phenylenevinylene) (PPV)‐based polymers were prepared. Diverse scanning probe techniques (atomic force microscopy (AFM), Kelvin force microscopy (KFM), current‐sensing AFM (CS‐AFM), and micro‐Raman mapping) are used to characterize morphologic, electronic as well as optoelectronic properties of the heterostructures. Morphologies of the heterostructures are correlated with microscopic and macroscopic electronic response to a broad‐band visible illumination. The data are discussed with respect to photovoltaic applications.

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