Electrical and optical characterization of extended defects in silicon mono‐cast material

Publisher: John Wiley & Sons Inc

E-ISSN: 1610-1642|9|10‐11|2158-2163

ISSN: 1862-6351

Source: PHYSICA STATUS SOLIDI (C) - CURRENT TOPICS IN SOLID STATE PHYSICS, Vol.9, Iss.10‐11, 2012-10, pp. : 2158-2163

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract