Probe current determination in analytical TEM/STEM and its application to the characterization of large area EDS detectors

Publisher: John Wiley & Sons Inc

E-ISSN: 1097-0029|1059-910X|10|886-893

ISSN: 1059-910x

Source: MICROSCOPY RESEARCH AND TECHNIQUE, Vol.1059-910X, Iss.10, 2015-10, pp. : 886-893

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