Revisiting Metal Sulfide Semiconductors: A Solution‐Based General Protocol for Thin Film Formation, Hall Effect Measurement, and Application Prospects

Publisher: John Wiley & Sons Inc

E-ISSN: 1616-3028|1616-301X|36|5739-5747

ISSN: 1616-301x

Source: ADVANCED FUNCTIONAL MATERIALS, Vol.1616-301X, Iss.36, 2015-09, pp. : 5739-5747

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract