Revisiting Metal Sulfide Semiconductors: A Solution‐Based General Protocol for Thin Film Formation, Hall Effect Measurement, and Application Prospects

Publisher： John Wiley & Sons Inc

E-ISSN： 1616-3028|1616-301X|36|5739-5747

ISSN： 1616-301x

Source： ADVANCED FUNCTIONAL MATERIALS, Vol.1616-301X, Iss.36, 2015-09, pp. : 5739-5747

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