Nano‐level position resolution for particle tracking in digital in‐line holographic microscopy

Publisher: John Wiley & Sons Inc

E-ISSN: 1365-2818|22-2720|1|100-106

ISSN: 0022-2720

Source: JOURNAL OF MICROSCOPY, Vol.22-2720, Iss.1, 2015-10, pp. : 100-106

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Abstract