Analysis of traction‐free assumption in high‐resolution EBSD measurements

Publisher: John Wiley & Sons Inc

E-ISSN: 1365-2818|22-2720|1|73-85

ISSN: 0022-2720

Source: JOURNAL OF MICROSCOPY, Vol.22-2720, Iss.1, 2015-10, pp. : 73-85

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Abstract