DFT study of adenine‐uracil base pair damage by OH radical
Publisher: John Wiley & Sons Inc
E-ISSN: 1099-1395|894-3230|10|645-651
ISSN: 0894-3230
Source: JOURNAL OF PHYSICAL ORGANIC CHEMISTRY (ELECTRONIC), Vol.894-3230, Iss.10, 2015-10, pp. : 645-651
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Abstract