Investigating the chain conformations of spin‐coated polymer thin films by ToF‐SIMS depth profiling

Publisher: John Wiley & Sons Inc

E-ISSN: 1096-9918|142-2421|10|953-960

ISSN: 0142-2421

Source: SURFACE AND INTERFACE ANALYSIS, Vol.142-2421, Iss.10, 2015-10, pp. : 953-960

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Abstract