Numerical investigation of carbon and silicon carbide contamination during the melting process of the Czochralski silicon crystal growth

Publisher： John Wiley & Sons Inc

E-ISSN： 1521-4079|50|6|458-463

ISSN： 0232-1300

Source： CRYSTAL RESEARCH AND TECHNOLOGY (ELECTRONIC), Vol.50, Iss.6, 2015-06, pp. : 458-463

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