Dielectrophoretic positioning of single nanoparticles on atomic force microscope tips for tip‐enhanced Raman spectroscopy

Publisher: John Wiley & Sons Inc

E-ISSN: 1522-2683|36|9-10|1142-1148

ISSN: 0173-0835

Source: ELECTROPHORESIS, Vol.36, Iss.9-10, 2015-05, pp. : 1142-1148

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Abstract