Publisher： John Wiley & Sons Inc
E-ISSN： 1521-4095|27|16|2635-2641
ISSN： 0935-9648
Source： ADVANCED MATERIALS, Vol.27, Iss.16, 2015-04, pp. : 2635-2641
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Abstract
The response of individual domains in wafer‐sized chemical vapor deposition graphene is measured by contactless sub‐terahertz interferometry, observing the intrinsic optical conductance and reaching very high mobility values. It is shown that charged scatterers limit the mobility, validating previous theoretical predictions, and sub‐terahertz quality assessment is demonstrated, as necessary for large‐scale applications in touchscreens, as well as wearable and optoelectronic devices.
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