Experimental test and life estimation of the OLED at normal working stress based on the luminance degradation model
Publisher： John Wiley & Sons Inc
E-ISSN： 1099-1271|30|4|371-375
ISSN： 1522-7235
Source： LUMINESCENCE: THE JOURNAL OF BIOLOGICAL AND CHEMICAL LUMINESCENCE (ELECTRONIC), Vol.30, Iss.4, 2015-06, pp. : 371-375
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Access to resources
Recommend
