Publisher： John Wiley & Sons Inc
E-ISSN： 1869-5868|55|6‐7|645-660
ISSN： 0021-2148
Source： ISRAEL JOURNAL OF CHEMISTRY (ELECTRONIC), Vol.55, Iss.6‐7, 2015-06, pp. : 645-660
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Electron Transport at Surfaces and Interfaces
CHIMIA International Journal for Chemistry, Vol. 66, Iss. 1, 2012-02 ,pp. :
Access to resources
Recommend
The Mechanism of Mediated Electron Transfer at Redox Active Surfaces
ELECTROANALYSIS (ELECTRONIC), Vol. 27, Iss. 4, 2015-04 ,pp. :
Transport phenomena at metal surfaces
Advances In Physics, Vol. 32, Iss. 5, 1983-01 ,pp. :
Electron transport in porous silicon
By Mathur R.G. Vivechana Mehra R.M. Mathur P.C. Jain V.K.
Thin Solid Films, Vol. 312, Iss. 1, 1998-01 ,pp. :