Statistical analysis of electronic excitation processes: Spatial location, compactness, charge transfer, and electron‐hole correlation

Publisher： John Wiley & Sons Inc

E-ISSN： 1096-987x|36|21|1609-1620

ISSN： 0192-8651

Source： JOURNAL OF COMPUTATIONAL CHEMISTRY, Vol.36, Iss.21, 2015-08, pp. : 1609-1620

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