Focus characterization at an X‐ray free‐electron laser by coherent scattering and speckle analysis
Publisher： John Wiley & Sons Inc
E-ISSN： 1600-5775|22|3|599-605
ISSN： 0909-0495
Source： JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol.22, Iss.3, 2015-05, pp. : 599-605
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