Resonant inelastic X‐ray scattering spectrometer with 25 meV resolution at the Cu K‐edge

Publisher： John Wiley & Sons Inc

E-ISSN： 1600-5775|22|4|961-967

ISSN： 0909-0495

Source： JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol.22, Iss.4, 2015-07, pp. : 961-967

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