New pathways for improved quantification of energy‐dispersive X‐ray spectra of semiconductors with multiple X‐ray lines from thin foils investigated in transmission electron microscopy

Publisher: John Wiley & Sons Inc

E-ISSN: 1365-2818|260|3|427-441

ISSN: 0022-2720

Source: JOURNAL OF MICROSCOPY, Vol.260, Iss.3, 2015-12, pp. : 427-441

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