Analysis of cross-correlation of interface roughness in multilayer structures with ultrashort periods

Author: Vainer Yu.   Pestov A.   Prokhorov K.   Salashchenko N.   Fraerman A.   Chernov V.   Chkhalo N.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1063-7761

Source: Journal of Experimental and Theoretical Physics, Vol.103, Iss.3, 2006-09, pp. : 346-353

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next