X-ray and luminescent analysis of finely dispersed β-FeSi2 films formed in Si by pulsed ion-beam treatment

Author: Bayazitov R.   Batalov R.   Terukov E.   Kudoyarova V.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1063-7834

Source: Physics of the Solid State, Vol.43, Iss.9, 2001-09, pp. : 1633-1636

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