Effect of the p-n junction breakdown mechanism on the Er3+ ion electroluminescence intensity and excitation efficiency in Si: Er epitaxial layers grown through sublimation molecular beam epitaxy

Author: Shmagin V.   Remizov D.   Krasil’nik Z.   Kuznetsov V.   Shabanov V.   Krasil’nikova L.   Kryzhkov D.   Drozdov M.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1063-7834

Source: Physics of the Solid State, Vol.46, Iss.1, 2004-01, pp. : 109-112

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