X-ray diffraction study of the effect of neutron irradiation on the defect formation in silicon crystals grown by the Czochralski method and annealed at high temperatures

Author： Makara V.   Novikov N.   Patsai B.  

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7834

Source： Physics of the Solid State, Vol.47, Iss.10, 2005-10, pp. : 1863-1868

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