Ellipsometry as a rapid method of establishing a correlation between the porosity and the gas sensitivity of tin dioxide layers

Author： Dimitrov D. Luchinin V. Moshnikov V. Panov M.

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7842

Source： Technical Physics, Vol.44, Iss.4, 1999-04, pp. : 468-469

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