Measurement of magnetic parameters of nanometer-thick conducting magnetic films using anisotropic magnetoresistive effect

Author： Medved A.   Kryshtal R.   Krikunov A.  

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7842

Source： Technical Physics, Vol.51, Iss.11, 2006-11, pp. : 1468-1473

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