Time evolution of three-crystal X-ray spectra during fluorination of a Pt/LaF₃/Si structure

Author： Nefedov A. Sbitnev S. Fanchenko S.

ISSN： 1063-7850

Source： Technical Physics Letters, Vol.24, Iss.7, 1998-07, pp. : 554-555

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Related content

Sensor based on a Pt/LaF₃/SiO₂/SiC structure for the detection of chlorofluorocarbons

By Filippov V. Vasil’ev A. Terent’ev A. Moritz W. Roth U.

Technical Physics, Vol. 44, Iss. 11, 1999-11 ,pp. : 1334-1339

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

Determination of the [Pt(NH₃)₅Cl]Br₃ crystal structure from X-ray powder diffraction data using multi-population genetic algorithm

Powder Diffraction, Vol. 32, Iss. S1, 2017-02 ,pp. : S110-S117

Cambridge University Press

Access to resources Recommend Favorite

X-ray absorption spectra of SiF4 and Si(CH3)4 in the Si K-shell excitation region

Journal of Physics: Conference Series , Vol. 235, Iss. 1, 2010-06 ,pp. : 139-146

IOP Publishing

Access to resources Recommend Favorite

Crystal field effect on specific heat and magnetic susceptibility of single crystals of CexLa1-xPt3Si

Journal of Physics: Conference Series , Vol. 150, Iss. 5, 2009-03 ,pp. : 691-694

IOP Publishing

Access to resources Recommend Favorite

DIFFRACTION STUDY OF THE a-Si:H STRUCTURE EVOLUTION DURING ANNEALING TREATMENTS PERFORMED DIRECTLY ON THE X RAY GONIOMETER

Le Journal de Physique Colloques, Vol. 42, Iss. C4, 1981-10 ,pp. : C4-237-C4-240

Edp Sciences

Access to resources Recommend Favorite