Atomic relocations in a two-layer Al/Ni system bombarded with ions having energies close to the sputtering threshold

ISSN： 1063-7850

Source： Technical Physics Letters, Vol.26, Iss.5, 2000-05, pp. : 372-374

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Related content

Defect formation in a two-layer Al/Ni crystal bombarded with ions having energies close to the sputtering threshold

By Kornich G. Betz G. Bazhin A.

Technical Physics Letters, Vol. 26, Iss. 5, 2000-05 ,pp. : 429-431

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

A COMPARISON OF ELECTRONIC SPUTTERING INDUCED BY MOLECULAR AND ATOMIC IONS

Le Journal de Physique Colloques, Vol. 50, Iss. C2, 1989-02 ,pp. : C2-15-C2-20

Edp Sciences

Access to resources Recommend Favorite

Drag effects in a two-layer system of spatially separated electrons and excitons

By Lozovik Yu. Nikitkov M.

Journal of Experimental and Theoretical Physics, Vol. 84, Iss. 3, 1997-03 ,pp. : 612-618

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

Mutual diffusion at the interface in a two-dimensional Ni-Al system

By Poletaev G. Starostenkov M.

Technical Physics Letters, Vol. 29, Iss. 6, 2003-06 ,pp. : 454-455

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

AlNi coatings on the internal surfaces of tubes

Le Journal de Physique IV, Vol. 09, Iss. PR8, 1999-09 ,pp. : Pr8-987-Pr8-994

Edp Sciences

Access to resources Recommend Favorite